TI : Automated Test Summit 09

The sixth annual Automated Test Summit featured NI and top industry experts who joined forces to discuss top trends influencing the automated test industry.

Experts discussed software-defined instrumentation, which provides the flexibility needed to perform every test using a common instrumentation core while applying the different algorithms required by the software-defined devices under test. They also examined multicore and parallel processing technologies that give engineers the ability to generate, capture, analyze, and process the gigabytes of raw data required to properly design and test today’s electronics products. In addition, the summit featured an entire workshop focused on developing automated test applications capable of achieving the highest possible throughput through parallel processing. A workshop was also devoted to RF and wireless test, which is among the fastest growing but also challenging electronic areas for engineers who need to learn wireless protocols and keep pace with the rapid introduction of new standards.

Now you can access this free content developed and presented by industry experts.

Keynotes include:

• Top Trends Changing the Face of Automated Test in 2009
• Lean Innovation: Testing in a Tough Economy

Workshops include:

1. Software-Defined Automated Test

• Moving to a Software-Defined Test Strategy
• Understanding Traditional versus Software-Defined System Design
• Choosing the Right Modular Instruments Based on Your DUT Requirements
• Techniques for Software-Defined Measurements and Analysis
• Tips from a System Integrator

2. Multicore and Parallel Test

• Maximizing Processor and Instrumentation Utilization
• Demystifying Multicore and Multithreaded Programming
• Implementing Parallel Test Architectures
• Increasing Parallel Data Streaming Bandwidth with PXI Express

3. RF and Wireless Test

• Understanding RF Test: What Every Engineer Should Know
• Optimizing WLAN Measurements: Five Tips to Improve Measurement Speed
• Mastering RF Record and Playback
• Configuring Phase-Coherent MIMO Test Systems
• Fundamentals of GPS Simulation

4. Real-Time and Protocol Aware Test

• Discovering New Techniques for Closed-Loop Test
• Architecting Adaptable Hardware-in-the-Loop (HIL) Test Systems
• Developing Protocol Aware Test Systems
• Designing Custom FPGA I/O for High-Performance Test

5. Test System Best Practices

• 10 Ways to Increase Your Throughput with Zero Cost
• Integrating GPIB, PXI, VXI, and LXI Hybrid Systems
• Uncovering PXI System Design Best Practices
• Exploring Advanced NI TestStand Software Architectures
• Best Practices for Large Application Development with LabVIEW
• Advanced Debugging Tips and Tricks in LabWindowsâ„¢/CVI
• Exploring Effective Calibration and Sparing Strategies

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